International Journal of Scientific & Technology Research

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IJSTR >> Volume 11 - Issue 01, January 2022 Edition

International Journal of Scientific & Technology Research  
International Journal of Scientific & Technology Research

Website: http://www.ijstr.org

ISSN 2277-8616

Modeling And Simulation Of Output Characteristics Of Metal Oxide Semiconductor Field Effect Transistor For Switching Application

[Full Text]



Babatunde S. Emmanuel, Paul O. Michael



Doping, semiconductor, substrate, transistor, MOSFET, electronic, switch



The Metal Oxide Semiconductor Field Effect Transistor (MOSFET) is an electronic device widely used as the building block in all commercial processors, memories, and digital integrated circuits (ICs). MOSFET is fabricated from semiconductor materials such as silicon. This paper presents the simulation study of the output characteristics of silicon MOSFET with a p-type substrate and n-type doped regions for source and drain interfaces as a switching device. The significance of the results obtained in the analysis is that at the applied input gate voltage greater than the threshold voltage of 1.2V, the MOSFET switch operates in the ON state while at input voltage lower than the threshold voltage indicated that the device is in the OFF state. In addition, at a gate voltage greater than the threshold voltage, the output drain current is directly proportional to the applied gate voltage. Perhaps, more significantly, as the value of the applied gate voltage increases the output drain current increases proportionally. These simulated characteristics of the MOSFET are therefore suitable for electronic switching applications.



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